Find the right solution for your LTCC, HTCC and may other ceramic inspections
Our most flexible and easy to use semi automatic ceramic inspection solution. This system is suited for most types of products and allows you to select from a wide range of optical and lighting solutions.
Based on the same Platform as the STRATUS III this system is designed specifically for inline applications like LTCC or HTCC inspections that can use a conveyor system. Through this approach the system is very flexible in image acquisition and toplight definition.
Our fastest system yet. Based on a ASYS conveyor solution this system uses a linescan camera with multiple toplights and a backlight to offer inspection speeds of up to 2500mm²/s including handling. This system is optimized for ceramic hybrids and PCBs and offers resolutions matching the layout requirements.
Our most flexible and reliable solution offering inspection on almost any product and almost any resolution. This solution goes from 0.5µm to 10µm optical resolution. It can handle boards, foils or carriers. The measurement capability of this system is up to 2.5µm over large distances while allowing very high throughput.
Our Inline MVI Metrology provides leading automated dimensional and positional measurement of general features and interposers on foils, boards and other materials. During a automated measurement inspection the system can also inspect for surface defects.
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