Our Inline MVI Metrology solution is our automatic solution to inspect and measure substrates. The systems main purpose is automated dimensional and positional measurement of general features and interposers on foils, boards and other materials. During a automated measurement inspection the system can also inspect for surface defects.

Our system requires very little setup and is mainly CAD based to ensure ease of use and simple product adjustment. The measurement is then performed on all structures with a very fast Stratus Vision patented scanning technology. During the measurement process the system can also detect all defects that are relevant in modern electronic production. Our solution can measure up to 10.000 interposers per second for diameter, position, roundness and save those values to the database to analyze production.